Erg SOCKET

With optimized electrical characteristics and instrument design, we provide the best quality and test solutions for semiconductor test processes.

With our engineering process led by experts, we ensure superior quality and fast delivery.

LGA & QFN Test BGA Test ETC Test

LGA & QFN TEST

Type Characteristics

01Life time increased through improvement of probe tip abrasion resistance
02Sn transition delay solution through special coating
03Application of premium materials to minimize deformation
04Reliable quality ensured through detailed measurements and process precision improvement
05Device guide error minimized through precision processing